Rapid Multi-Residue Screening and Confirmation Using a New Line of Pursuit "Fast LC" ColumnsByHuqun Liu,Jurgen Machielse,Eugene Chang,Anita DerMartirosian,Ritu Arora,Richard Robinson,Seok-Bong Choi,Frankie Button,Norwin von Döhren,Greg Gerrain,VarianFebruary 1st 2008The Application Notebook