News|Articles|March 5, 2024
Simple Rapid Analysis of Formaldehyde Impurities in Gelucire
Author(s)Syft Technologies Inc
This application note describes how SIFT-MS greatly simplifies formaldehyde detection and quantitation through direct, instantaneous, and sensitive (sub-ppbV) sample ionization. Sample throughputs of up to 250+ samples/day are possible using the method detailed in this study.
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