A novel approach is described for the quantitation of three additives typically used in copper plating using a dual LC system with an ECD and a CAD.
Marc Plante
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Articles by Marc Plante
Surfactants present a real challenge to the analytical chemist as they are a very complex class of chemical compounds.
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An Easy Way to a Fast Universal Method for Surfactant AnalysisPublished: July 4th 2012 | Updated:
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