Vaughan S. Langford | Authors

Vaughan Langford is a principal scientist at Syft Technologies in New Zealand. He joined Syft in late 2002 after completing his Ph.D. in physical chemistry at the University of Canterbury, and postdoctoral fellowships at the Universities of Geneva, Western Australia, and Canterbury. He has over 30 peer-reviewed publications on a wide range of SIFT-MS applications, and has contributed numerous conference papers. Direct correspondence: vaughan.langford@syft.com

Articles

A Fast, Simplified Approach to Quantitative Headspace Analysis of Volatile Impurities in Drug and Packaging Products

Multiple headspace extraction (MHE) can be readily implemented with automated headspace-selected ion flow tube mass spectrometry (SIFT-MS).

Rapid Untargeted Screening of Food and Ingredient Aroma Using Direct-Injection Mass Spectrometry

Applying headspace-SIFT-MS to untargeted screening of food products and ingredients.

Demystifying Sample Preparation for Headspace Analysis Using Direct Injection Mass Spectrometry

Direct-injection mass spectrometry (DIMS) and gas chromatography (GC) approaches have some significant differences that are pertinent when analyzing volatile organic compounds (VOCs). We explain.

High-Throughput Analysis of Polymers for Benzene and Volatile MOSH and MOAH Residues

SIFT–MS analysis has potential to screen large numbers of packaging samples for the volatile MOH fraction, providing a rapid indication of packaging material contamination.

Demystifying Sample Preparation for Headspace Analysis Using Direct Injection MS

The differences between DIMS and GC approaches are presented.

Real-Time Monitoring of Volatile Organic Compounds in Ambient Air Using Direct-Injection Mass Spectrometry

Newer direct-injection mass spectrometry techniques can improve real-time monitoring of volatile organic compounds.